Click on the Tune Tab in the Master Panel. Set the tune high and low frequency according to the cantilevers being used and the application. For general tapping mode cantilevers: ...

FA engineers are expected to produce accurate results. Thus, there is no room for error when it comes to the data provided by instruments. Due to its data precision ...

An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...

Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...

Follow Bruker and explore the latest applications of AFM in the semiconductor industry with a panel of experts. What are the recommended cantilevers for measuring the mechanical properties of ...