Each new manufacturing process generation brings with it a whole new set of challenges. In an era of multimillion-gate complexity and increasing density of nanometer manufacturing defects, a key ...

For the past five years, the cost of test has prevailed as the hottest topic in test. During this period, automated test equipment (ATE) has made a dramatic move towards low-cost design for test (DFT) ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Test compression technology was invented to address the problem of escalating test-pattern size. Compression allows more test vectors to be applied to an IC in a shorter time and with fewer tester ...

Left-shifting DFT, scalable tests from manufacturing to the field, enabling system-level tests for in-field debug.

This video demonstrates the compression test performed on a milk crate using Instron universal testing machine. Compression testing was performed to measure the strength of the milk crate. Instron ...

General Electric will find out later this summer how the core of the new engine for the 777X performs in an isolated ground test. The maturation testing on the high pressure compressor rig will ...

For the past five years, the cost of test has prevailed as the hottest topic in test. During this period, automated test equipment (ATE) has made a dramatic move towards low-cost design for test (DFT) ...