Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Apple is said to be working on its smart glasses, unofficially called the "Apple Glasses," and the company is reportedly testing at least four designs for the new wearable, according to an analyst.

Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...

When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...

Apple (AAPL) is testing four designs for its smart AI glasses that will rival Meta's (META) product, with plans to launch some or all of them, Bloomberg News reported. The styles being tested are a ...

With logic gate counts on microprocessors soaring, chipmakers now face a vexing problem -- how to test a billion-gate chip in a reasonable amount of time. The challenge of testing the so-called ...

The advent of delivering 10 Gigabit Ethernet connections to the enterprise and data center opens up a myriad of test challenges. Constructing a comprehensive and standards-based test environment is ...