Electronic Design

Using ATE for Efficient DigRF Interface Testing

Although the term DigRF may lead to initial impressions of a digital signal somehow integrated into an RF signal path, this is not the case. DigRF is a published standard that describes a digital ...
Business Wire

Keysight’s 224G Ethernet Test Solutions Enable System-on-a-Chip Makers to Validate Next Generation High-speed Digital Interface Technology

SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
Semiconductor Engineering

Advanced Digital Process Nodes Drive Semiconductor Test Innovations

Global internet traffic is growing exponentially, with no sign of slowing, and this demand is driving the evolution of the semiconductor industry. The appetite for more and more data requires sensors ...
EDN

Protecting embedded IoT devices with fuzz testing

With the proliferation of IoT devices come increased embedded security attacks. Historically, embedded system engineers have ignored device-layer security despite the many areas of embedded devices ...
Semiconductor Engineering

Automate Memory Test Through A Shared Bus Interface

The use of memory-heavy IP in SoCs for automotive, artificial intelligence (AI), and processor applications is steadily increasing. However, these memory-heavy IP often have only a single access point ...